Nanogap based graphene coated AFM tips with high spatial resolution, conductivity and durability.

نویسندگان

  • Mario Lanza
  • Teng Gao
  • Zixuan Yin
  • Yanfeng Zhang
  • Zhongfan Liu
  • Yuzhen Tong
  • Ziyong Shen
  • Huiling Duan
چکیده

After one decade of analyzing the intrinsic properties of graphene, interest into the development of graphene-based devices and micro electromechanical systems is increasing. Here, we fabricate graphene-coated atomic force microscope tips by growing the graphene on copper foil and transferring it onto the apex of a commercially available AFM tip. The resulting tip exhibits surprising enhanced resolution in nanoscale electrical measurements. By means of topographic AFM maps and statistical analyses we determine that this superior performance may be related to the presence of a nanogap between the graphene and the tip apex, which reduces the tip radius and tip-sample contact area. In addition, the graphene-coated tips show a low tip-sample interaction, high conductivity and long life times. The novel fabrication-friendly tip could improve the quality and reliability of AFM experiments, while reducing the cost of AFM-based research.

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Gold nanoparticle coated silicon tips for Kelvin probe force microscopy in air.

The tip apex dimensions and geometry of the conductive probe remain the major limitation to the resolution of Kelvin probe force microscopy (KPFM). One of the possible strategies to improve the spatial resolution of surface potential images consists in the development of thinner and more durable conductive tips. In an effort to improve the lateral resolution of topography and surface potential ...

متن کامل

Conduction coefficient modeling in bilayer graphene based on schottky transistors

Nowadays carbon nanoparticles are applied on the island of single electron transistor and Nano-transistors. The basis of single electron devices (SEDs) is controllable single electron transfer between small conducting islands. Based on the important points in quantum mechanics, when a wave passes through several spatial regions with different boundaries, the wave function of the first region di...

متن کامل

Magnetic force microscopy using fabricated cobalt-coated carbon nanotubes probes

Magnetic force microscope ( MFM ) is a powerful technique for mapping the magnetic force gradient above the sample surface. Herein, single-wall carbon nanotubes (SWCNT) were used to fabricate MFM probe by dielectrophoresis method which is a reproducible and cost-effective technique. The effect of induced voltage on the deposition manner of carbon nanotubes (CNT) on the atomic force microscope (...

متن کامل

Rational fabrication of a gold-coated AFM TERS tip by pulsed electrodeposition.

Reproducible fabrication of sharp gold- or silver-coated tips has become the bottleneck issue in tip-enhanced Raman spectroscopy, especially for atomic force microscopy (AFM)-based TERS. Herein, we developed a novel method based on pulsed electrodeposition to coat a thin gold layer over atomic force microscopy (AFM) tips to produce plasmonic TERS tips with high reproducibility. We systematicall...

متن کامل

Aspect-ratio and lateral-resolution enhancement in force microscopy by attaching nanoclusters generated by an ion cluster source at the end of a silicon tip.

One of the factors that limit the spatial resolution in atomic force microscopy (AFM) is the physical size of the probe. This limitation is particularly severe when the imaged structures are comparable in size to the tip's apex. The resolution in the AFM is usually enhanced by using sharp tips with high aspect ratios. In the present paper we propose an approach to modify AFM tips that consists ...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:
  • Nanoscale

دوره 5 22  شماره 

صفحات  -

تاریخ انتشار 2013